Müller, Raoul; Schuhmacher, Dominic; Mateu, Jorge Metrics and barycenters for point pattern data. (English) Zbl 1447.62140 Stat. Comput. 30, No. 4, 953-972 (2020). MSC: 62R20 60G55 62P25 PDFBibTeX XMLCite \textit{R. Müller} et al., Stat. Comput. 30, No. 4, 953--972 (2020; Zbl 1447.62140) Full Text: DOI arXiv
Schuhmacher, Dominic; Stucki, Kaspar Gibbs point process approximation: total variation bounds using Stein’s method. (English) Zbl 1322.60060 Ann. Probab. 42, No. 5, 1911-1951 (2014). Reviewer: B. P. Harlamov (St. Peterburg) MSC: 60G55 60G60 60J80 60K35 PDFBibTeX XMLCite \textit{D. Schuhmacher} and \textit{K. Stucki}, Ann. Probab. 42, No. 5, 1911--1951 (2014; Zbl 1322.60060) Full Text: DOI arXiv Euclid
Stucki, Kaspar; Schuhmacher, Dominic Bounds for the probability generating functional of a Gibbs point process. (English) Zbl 1295.60061 Adv. Appl. Probab. 46, No. 1, 21-34 (2014). Reviewer: Viktor Ohanyan (Erevan) MSC: 60G55 62M30 PDFBibTeX XMLCite \textit{K. Stucki} and \textit{D. Schuhmacher}, Adv. Appl. Probab. 46, No. 1, 21--34 (2014; Zbl 1295.60061) Full Text: DOI arXiv Euclid
Baddeley, A.; Berman, M.; Fisher, N. I.; Hardegen, A.; Milne, R. K.; Schuhmacher, D.; Shah, R.; Turner, R. Spatial logistic regression and change-of-support in Poisson point processes. (English) Zbl 1329.62253 Electron. J. Stat. 4, 1151-1201 (2010). MSC: 62H11 62J12 60G55 62M30 60E99 62P12 PDFBibTeX XMLCite \textit{A. Baddeley} et al., Electron. J. Stat. 4, 1151--1201 (2010; Zbl 1329.62253) Full Text: DOI Euclid
Schuhmacher, Dominic Stein’s method and Poisson process approximation for a class of Wasserstein metrics. (English) Zbl 1204.60039 Bernoulli 15, No. 2, 550-568 (2009). MSC: 60G55 60F99 62E17 PDFBibTeX XMLCite \textit{D. Schuhmacher}, Bernoulli 15, No. 2, 550--568 (2009; Zbl 1204.60039) Full Text: DOI arXiv
Schuhmacher, Dominic Distance estimates for dependent thinnings of point processes with densities. (English) Zbl 1196.60089 Electron. J. Probab. 14, 1080-1116 (2009). MSC: 60G55 60D05 PDFBibTeX XMLCite \textit{D. Schuhmacher}, Electron. J. Probab. 14, 1080--1116 (2009; Zbl 1196.60089) Full Text: DOI arXiv EuDML EMIS
Schuhmacher, Dominic; Xia, Aihua A new metric between distributions of point processes. (English) Zbl 1155.60020 Adv. Appl. Probab. 40, No. 3, 651-672 (2008). Reviewer: Viktor Oganyan (Erevan) MSC: 60G55 60F05 62M30 PDFBibTeX XMLCite \textit{D. Schuhmacher} and \textit{A. Xia}, Adv. Appl. Probab. 40, No. 3, 651--672 (2008; Zbl 1155.60020) Full Text: DOI arXiv
Schuhmacher, Dominic Distance estimates for dependent superpositions of point processes. (English) Zbl 1080.60050 Stochastic Processes Appl. 115, No. 11, 1819-1837 (2005). Reviewer: R. E. Maiboroda (Kyïv) MSC: 60G55 62E20 PDFBibTeX XMLCite \textit{D. Schuhmacher}, Stochastic Processes Appl. 115, No. 11, 1819--1837 (2005; Zbl 1080.60050) Full Text: DOI Link
Schuhmacher, Dominic Upper bounds for spatial point process approximations. (English) Zbl 1067.60022 Ann. Appl. Probab. 15, No. 1B, 615-651 (2005). Reviewer: Viktor Oganyan (Erevan) MSC: 60G55 62E20 62G07 PDFBibTeX XMLCite \textit{D. Schuhmacher}, Ann. Appl. Probab. 15, No. 1B, 615--651 (2005; Zbl 1067.60022) Full Text: DOI arXiv
Schuhmacher, Dominic Distance estimates for Poisson process approximations of dependent thinnings. (English) Zbl 1071.60034 Electron. J. Probab. 10, Paper No. 5, 165-201 (2005). Reviewer: Evgueni Spodarev (Ulm) MSC: 60G55 60E99 60D05 PDFBibTeX XMLCite \textit{D. Schuhmacher}, Electron. J. Probab. 10, Paper No. 5, 165--201 (2005; Zbl 1071.60034) Full Text: DOI EuDML EMIS