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Found 89 Documents (Results 1–89)

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Boston: Birkhäuser (ISBN 0-8176-3230-1/hbk). xxv, 484 p. (2004).
MSC:  62J10 62-01 62Pxx
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Huber-Carol, C. (ed.) et al., Goodness-of-fit tests and model validity. Papers from the international conference, Paris, France, May 29–31, 2000. Boston: Birkhäuser (ISBN 0-8176-4209-9). Statistics for Industry and Technology, 495-503 (2002).
MSC:  62G20 62G05 62F12
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Mathematics and its Applications (Dordrecht). 362. Dordrecht: Kluwer Academic Publishers. ix, 262 p. Dfl. 195.00; $ 135.00; £88.00 (1996).
Reviewer: J.Antoch (Praha)
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J. Math. Sci., New York 68, No. 4, 438-450 (1994); translation from Zap. Nauchn. Semin. Leningr. Otd. Mat. Inst. Steklova 184, 62-79 (1990).
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Full Text: DOI
Matsusita, K. (ed.) et al., Statistical sciences and data analysis. Proceedings of the third Pacific Area statistical conference, Makuhari, Japan, December 11-13, 1991. Utrecht: VSP. 187-196 (1993).
MSC:  62H12
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