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Found 146 Documents (Results 1–100)

100
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Providence, RI: American Mathematical Society (AMS) (ISBN 978-1-4704-4869-1/hbk; 978-1-4704-5200-1/ebook). xv, 323 p. (2019).
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J. Math. Sci., New York 228, No. 5, 495-500 (2018); translation from Statisticheskie Metody Otsenivaniya i Proverki Gipotez 21, 38-46 (2006).
Reviewer: Reviewer (Berlin)
MSC:  62G10
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Atlantis Studies in Probability and Statistics 7. Amsterdam: Atlantis Press (ISBN 978-94-6239-138-3/hbk; 978-94-6239-139-0/ebook). x, 125 p. (2017).
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Sutradhar, Brajendra C. (ed.), Advances and challenges in parametric and semi-parametric analysis for correlated data. Proceedings of the 2015 international symposium in statistics, ISS 2015, St. John’s, Canada, July 6–8, 2015. Cham: Springer. Lect. Notes Stat. 218, 41-71 (2016).
Reviewer: Reviewer (Berlin)
MSC:  62J12 62F10 62E20
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Monographs on Statistics and Applied Probability 106. Boca Raton, FL: Chapman & Hall/CRC (ISBN 1-58488-631-5/hbk; 978-1-4200-1134-0/ebook). x, 396 p. (2006).
MSC:  62J12 62-02 62Pxx
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Interdisciplinary Statistics. Boca Raton, FL: Chapman & Hall/CRC (ISBN 1-58488-000-7/hbk; 978-0-203-48943-7/ebook). xi, 508 p. (2004).
MSC:  62-02 62J12 65C60 62Pxx
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Huber-Carol, C. (ed.) et al., Goodness-of-fit tests and model validity. Papers from the international conference, Paris, France, May 29–31, 2000. Boston: Birkhäuser (ISBN 0-8176-4209-9). Statistics for Industry and Technology, 57-64 (2002).
Reviewer: Reviewer (Berlin)
MSC:  62G10 62-04
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Rieder, Helmut (ed.), Robust statistics, data analysis, and computer intensive methods. In honor of Peter Huber’s 60th birthday. New York, NY: Springer-Verlag. Lect. Notes Stat., Springer-Verlag. 109, 17-34 (1996).
Reviewer: Reviewer (Berlin)
MSC:  62F35 62J12 62F12
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