Kalogridis, Ioannis; Van Aelst, Stefan \(M\)-type penalized splines with auxiliary scale estimation. (English) Zbl 1460.62052 J. Stat. Plann. Inference 212, 97-113 (2021). MSC: 62G08 62G20 62G35 PDFBibTeX XMLCite \textit{I. Kalogridis} and \textit{S. Van Aelst}, J. Stat. Plann. Inference 212, 97--113 (2021; Zbl 1460.62052) Full Text: DOI arXiv
Dutta, Subhajit; Sarkar, Soham; Ghosh, Anil K. Multi-scale classification using localized spatial depth. (English) Zbl 1434.62119 J. Mach. Learn. Res. 17, Paper No. 218, 30 p. (2016). MSC: 62H30 62F15 PDFBibTeX XMLCite \textit{S. Dutta} et al., J. Mach. Learn. Res. 17, Paper No. 218, 30 p. (2016; Zbl 1434.62119) Full Text: arXiv Link
Ruppert, David; Wand, M. P.; Carroll, Raymond J. Semiparametric regression during 2003–2007. (English) Zbl 1326.62094 Electron. J. Stat. 3, 1193-1256 (2009). MSC: 62G08 62G05 62J12 62F15 62G20 65C60 62-02 PDFBibTeX XMLCite \textit{D. Ruppert} et al., Electron. J. Stat. 3, 1193--1256 (2009; Zbl 1326.62094) Full Text: DOI Euclid