Chun, So Yeon; Browne, Michael W.; Shapiro, Alexander Modified distribution-free goodness-of-fit test statistic. (English) Zbl 1402.62305 Psychometrika 83, No. 1, 48-66 (2018). MSC: 62P15 62H15 62H25 PDFBibTeX XMLCite \textit{S. Y. Chun} et al., Psychometrika 83, No. 1, 48--66 (2018; Zbl 1402.62305) Full Text: DOI
Yuan, Ke-Hai; Chan, Wai Biases and standard errors of standardized regression coefficients. (English) Zbl 1231.62134 Psychometrika 76, No. 4, 670-690 (2011). MSC: 62J05 62H12 65C05 62F12 PDFBibTeX XMLCite \textit{K.-H. Yuan} and \textit{W. Chan}, Psychometrika 76, No. 4, 670--690 (2011; Zbl 1231.62134) Full Text: DOI
Yuan, Ke-Hai; Hayashi, Kentaro On Muthén’s maximum likelihood for two-level covariance structure models. (English) Zbl 1306.62523 Psychometrika 70, No. 1, 147-167 (2005). MSC: 62P15 62H12 62J10 PDFBibTeX XMLCite \textit{K.-H. Yuan} and \textit{K. Hayashi}, Psychometrika 70, No. 1, 147--167 (2005; Zbl 1306.62523) Full Text: DOI
Yuan, Ke-Hai; Bentler, Peter M. On the asymptotic distributions of two statistics for two-level covariance structure models within the class of elliptical distributions. (English) Zbl 1306.62519 Psychometrika 69, No. 3, 437-457 (2004). MSC: 62P15 PDFBibTeX XMLCite \textit{K.-H. Yuan} and \textit{P. M. Bentler}, Psychometrika 69, No. 3, 437--457 (2004; Zbl 1306.62519) Full Text: DOI