Zhan, Wenfa; Liang, Huaguo; Jiang, Cuiyun; Huang, Zhengfeng; El-Maleh, Aiman A scheme of test data compression based on coding of even bits marking and selective output inversion. (English) Zbl 1208.68114 Comput. Electr. Eng. 36, No. 5, 969-977 (2010). MSC: 68P30 PDFBibTeX XMLCite \textit{W. Zhan} et al., Comput. Electr. Eng. 36, No. 5, 969--977 (2010; Zbl 1208.68114) Full Text: DOI
Ouyang, Yi-ming; Feng, Wei; Liang, Hua-guo An optimized test ports selecting method under power constraint in NoC. (Chinese. English summary) Zbl 1173.68423 J. Comput. Appl. 28, No. 4, 1026-1028 (2008). MSC: 68M99 PDFBibTeX XMLCite \textit{Y.-m. Ouyang} et al., J. Comput. Appl. 28, No. 4, 1026--1028 (2008; Zbl 1173.68423)