Cole, E. A. B. Integral evaluation in semiconductor device modelling using simulated annealing with Bose-Einstein statistics. (English) Zbl 1203.82110 Int. J. Numer. Model. 20, No. 4, 197-215 (2007). MSC: 82D37 68T05 90C59 82-08 65D20 82C10 78A40 PDFBibTeX XMLCite \textit{E. A. B. Cole}, Int. J. Numer. Model. 20, No. 4, 197--215 (2007; Zbl 1203.82110) Full Text: DOI
Cole, E. A. B. The phase plane method for the solution of equations applied to semiconductor device modelling. (English) Zbl 1056.78016 Int. J. Numer. Model. 17, No. 4, 335-352 (2004). Reviewer: Alan Jeffrey (Newcastle upon Tyne) MSC: 78M25 PDFBibTeX XMLCite \textit{E. A. B. Cole}, Int. J. Numer. Model. 17, No. 4, 335--352 (2004; Zbl 1056.78016) Full Text: DOI
Hussain, Shahzad; Cole, Eric A. B.; Snowden, Christopher M. Hot-electron numerical modelling of short gate length pHEMTs applied to novel field plate structures. (English) Zbl 1035.82504 Int. J. Numer. Model. 16, No. 1, 15-28 (2003). MSC: 82D37 PDFBibTeX XMLCite \textit{S. Hussain} et al., Int. J. Numer. Model. 16, No. 1, 15--28 (2003; Zbl 1035.82504) Full Text: DOI