Kent, John T.; Mardia, Kanti V. Spatial analysis. (English) Zbl 1491.62002 Wiley Series in Probability and Statistics. Hoboken, NJ: John Wiley & Sons (ISBN 978-0-471-63205-4/hbk; 978-1-118-76355-1/ebook). xxviii, 372 p. (2022). MSC: 62-01 62M30 62M40 62H11 62H35 62J05 62P12 92D40 86A32 94A08 PDFBibTeX XMLCite \textit{J. T. Kent} and \textit{K. V. Mardia}, Spatial analysis. Hoboken, NJ: John Wiley \& Sons (2022; Zbl 1491.62002) Full Text: DOI
Bajorski, Peter Statistics for imaging, optics, and photonics. (English) Zbl 1271.62010 Wiley Series in Probability and Statistics. Hoboken, NJ: John Wiley & Sons (ISBN 978-0-470-50945-6/hbk; 978-1-118-12195-5/ebook). xiv, 379 p. (2012). MSC: 62-02 62H35 62Hxx 94A08 62M40 PDFBibTeX XMLCite \textit{P. Bajorski}, Statistics for imaging, optics, and photonics. Hoboken, NJ: John Wiley \& Sons (2012; Zbl 1271.62010) Full Text: DOI
Qiu, Peihua Image processing and jump regression analysis. (English) Zbl 1070.68146 Wiley Series in Probability and Statistics. Hoboken, NJ: John Wiley & Sons (ISBN 0-471-42099-9/hbk; 978-0-471-73315-7/ebook). xxiii, 305 p. (2005). Reviewer: Jean Th. Lapresté (Aubière) MSC: 68U10 68-02 94A08 PDFBibTeX XMLCite \textit{P. Qiu}, Image processing and jump regression analysis. Hoboken, NJ: John Wiley \& Sons (2005; Zbl 1070.68146) Full Text: DOI