Pagli, Linda; Pucci, Geppino Counting the number of fault patterns in redundant VLSI arrays. (English) Zbl 0796.94022 Inf. Process. Lett. 50, No. 6, 337-342 (1994). Summary: In VLSI technology, redundancy is a commonly adopted technique to provide reconfiguration capabilities to regular architectures. This paper proves upper and lower bounds on the number of minimal fault patterns (minimal set of faulty processors) which affect a link-redundant linear array in an unrepairable way, for both the cases of bidirectional and unidirectional links. Cited in 5 Documents MSC: 94C12 Fault detection; testing in circuits and networks 68M20 Performance evaluation, queueing, and scheduling in the context of computer systems Keywords:distributed systems; fault tolerance; parallel processing; performance evaluation; VLSI circuits; upper and lower bounds; number of minimal fault patterns PDF BibTeX XML Cite \textit{L. Pagli} and \textit{G. Pucci}, Inf. Process. Lett. 50, No. 6, 337--342 (1994; Zbl 0796.94022) Full Text: DOI References: [1] Brlkhale, K.P.; Banerjee, P., Reconfiguration strategies in VLSI processor arrays, Proc. internat. conf. on computer aided design, 418-421, (1988) [2] Graham, R.L.; Knuth, D.E.; Patashnik, O., Concrete mathematics, (1989), Addison-Wesley Reading, MA · Zbl 0668.00003 [3] Greene, J.W.; Gamal, A., Configuration of VLSI arrays in the presence of defects, J. ACM, 31, 4, 694-717, (1984) · Zbl 0632.94033 [4] Nayak, A., On reconfigurability of some regular architectures, () [5] A. Nayak, L. Pagli and N. Santoro, Testing for catastrophic fault patterns in reconfigurable arrays with arbitrary link redundancy, IEEE Trans. Comput. Aided Design, submitted. · Zbl 0875.68157 [6] Nayak, A.; Santoro, N.; Tan, R., Fault-intolerance of reconfigurable systolic arrays, Proc. 20th internat. symp. on fault tolerant computing, 202-209, (1990) This reference list is based on information provided by the publisher or from digital mathematics libraries. Its items are heuristically matched to zbMATH identifiers and may contain data conversion errors. It attempts to reflect the references listed in the original paper as accurately as possible without claiming the completeness or perfect precision of the matching.