Milner, David; Raz, Shmuel; Hel-Or, Hagit; Keren, Daniel; Nevo, Eviatar A new measure of symmetry and its application to classification of bifurcating structures. (English) Zbl 1111.68645 Pattern Recognition 40, No. 8, 2237-2250 (2007). MSC: 68T10 68U05 PDFBibTeX XMLCite \textit{D. Milner} et al., Pattern Recognition 40, No. 8, 2237--2250 (2007; Zbl 1111.68645) Full Text: DOI
Bishnu, Arijit; Das, Sandip; Nandy, Subhas C.; Bhattacharya, Bhargab B. Simple algorithms for partial point set pattern matching under rigid motion. (English) Zbl 1098.68928 Pattern Recognition 39, No. 9, 1662-1671 (2006). MSC: 68U05 68T10 PDFBibTeX XMLCite \textit{A. Bishnu} et al., Pattern Recognition 39, No. 9, 1662--1671 (2006; Zbl 1098.68928) Full Text: DOI
Zouaki, Hamid Convex set symmetry measurement using Blaschke addition. (English) Zbl 1029.68128 Pattern Recognition 36, No. 3, 753-763 (2003). MSC: 68T10 68W05 PDFBibTeX XMLCite \textit{H. Zouaki}, Pattern Recognition 36, No. 3, 753--763 (2003; Zbl 1029.68128) Full Text: DOI
Vleugels, Jules; Veltkamp, Remco C. Efficient image retrieval through vantage objects. (English) Zbl 0988.68067 Pattern Recognition 35, No. 1, 69-80 (2002). MSC: 68P15 68U10 68T10 PDFBibTeX XMLCite \textit{J. Vleugels} and \textit{R. C. Veltkamp}, Pattern Recognition 35, No. 1, 69--80 (2002; Zbl 0988.68067) Full Text: DOI
Radhakrishnan, V.; Nagaraja, G. Inference of even linear grammars and its application to picture description languages. (English) Zbl 0653.68077 Pattern Recognition 21, No. 1, 55-62 (1988). MSC: 68Q45 68T10 PDFBibTeX XMLCite \textit{V. Radhakrishnan} and \textit{G. Nagaraja}, Pattern Recognition 21, No. 1, 55--62 (1988; Zbl 0653.68077) Full Text: DOI