Zhang, Pan; Huang, Lan Stability for a 3D Ladyzhenskaya fluid model with unbounded variable delay. (English) Zbl 07804467 Electron. Res. Arch. 31, No. 12, 7602-7627 (2023). MSC: 35Q30 76D05 35B40 35B35 35B65 35A01 35A02 35R07 PDFBibTeX XMLCite \textit{P. Zhang} and \textit{L. Huang}, Electron. Res. Arch. 31, No. 12, 7602--7627 (2023; Zbl 07804467) Full Text: DOI
Liu, Guowei; Xu, Hao; Zhao, Caidi Upper semi-continuity of pullback attractors for bipolar fluids with delay. (English) Zbl 07804388 Electron. Res. Arch. 31, No. 10, 5996-6011 (2023). MSC: 35B41 35Q35 PDFBibTeX XMLCite \textit{G. Liu} et al., Electron. Res. Arch. 31, No. 10, 5996--6011 (2023; Zbl 07804388) Full Text: DOI
Yang, Xiaojie; Liu, Hui; Deng, Haiyun; Sun, Chengfeng Pullback \(\mathcal{D}\)-attractors of the three-dimensional non-autonomous micropolar equations with damping. (English) Zbl 1486.35069 Electron. Res. Arch. 30, No. 1, 314-334 (2022). MSC: 35B41 35Q35 PDFBibTeX XMLCite \textit{X. Yang} et al., Electron. Res. Arch. 30, No. 1, 314--334 (2022; Zbl 1486.35069) Full Text: DOI
Cui, Haibo; Gao, Junpei; Yao, Lei Asymptotic behavior of the one-dimensional compressible micropolar fluid model. (English) Zbl 1458.35326 Electron. Res. Arch. 29, No. 2, 2063-2075 (2021). MSC: 35Q35 76N10 76A05 76T20 76U05 35B40 PDFBibTeX XMLCite \textit{H. Cui} et al., Electron. Res. Arch. 29, No. 2, 2063--2075 (2021; Zbl 1458.35326) Full Text: DOI
Sun, Wenlong The boundedness and upper semicontinuity of the pullback attractors for a 2D micropolar fluid flows with delay. (English) Zbl 1448.35049 Electron. Res. Arch. 28, No. 3, 1343-1356 (2020). MSC: 35B41 35B40 35Q35 PDFBibTeX XMLCite \textit{W. Sun}, Electron. Res. Arch. 28, No. 3, 1343--1356 (2020; Zbl 1448.35049) Full Text: DOI
Sun, Zhi-Ying; Huang, Lan; Yang, Xin-Guang Exponential stability and regularity of compressible viscous micropolar fluid with cylinder symmetry. (English) Zbl 1446.35140 Electron. Res. Arch. 28, No. 2, 861-878 (2020). MSC: 35Q35 76N10 76A05 35B35 35B65 35B06 PDFBibTeX XMLCite \textit{Z.-Y. Sun} et al., Electron. Res. Arch. 28, No. 2, 861--878 (2020; Zbl 1446.35140) Full Text: DOI