Barnhart, Huiman X.; Williamson, John M. Weighted least-squares approach for comparing correlated kappa. (English) Zbl 1210.62142 Biometrics 58, No. 4, 1012-1019 (2002). MSC: 62P10 92C50 65C60 62P15 PDFBibTeX XMLCite \textit{H. X. Barnhart} and \textit{J. M. Williamson}, Biometrics 58, No. 4, 1012--1019 (2002; Zbl 1210.62142) Full Text: DOI
Barnhart, Huiman X.; Williamson, John M. Modeling concordance correlation via GEE to evaluate reproducibility. (English) Zbl 1209.62255 Biometrics 57, No. 3, 931-940 (2001). MSC: 62P10 62H20 62N02 65C60 PDFBibTeX XMLCite \textit{H. X. Barnhart} and \textit{J. M. Williamson}, Biometrics 57, No. 3, 931--940 (2001; Zbl 1209.62255) Full Text: DOI