Altschuler, Dylan J. Critical window of the symmetric perceptron. (English) Zbl 07790290 Electron. J. Probab. 28, Paper No. 123, 28 p. (2023). MSC: 60C05 PDFBibTeX XMLCite \textit{D. J. Altschuler}, Electron. J. Probab. 28, Paper No. 123, 28 p. (2023; Zbl 07790290) Full Text: DOI arXiv
De Ambroggio, Umberto; Roberts, Matthew I. The probability of unusually large components for critical percolation on random \(d\)-regular graphs. (English) Zbl 07721280 Electron. J. Probab. 28, Paper No. 94, 55 p. (2023). MSC: 60C05 05C80 PDFBibTeX XMLCite \textit{U. De Ambroggio} and \textit{M. I. Roberts}, Electron. J. Probab. 28, Paper No. 94, 55 p. (2023; Zbl 07721280) Full Text: DOI arXiv
Coulson, Matthew; Perarnau, Guillem Largest component of subcritical random graphs with given degree sequence. (English) Zbl 1517.05158 Electron. J. Probab. 28, Paper No. 34, 28 p. (2023). MSC: 05C80 05C82 60C05 60F05 PDFBibTeX XMLCite \textit{M. Coulson} and \textit{G. Perarnau}, Electron. J. Probab. 28, Paper No. 34, 28 p. (2023; Zbl 1517.05158) Full Text: DOI arXiv Link
Enriquez, Nathanaël; Faraud, Gabriel; Ménard, Laurent; Noiry, Nathan Depth first exploration of a configuration model. (English) Zbl 1490.60268 Electron. J. Probab. 27, Paper No. 53, 27 p. (2022). MSC: 60K35 82C21 60J20 60F10 PDFBibTeX XMLCite \textit{N. Enriquez} et al., Electron. J. Probab. 27, Paper No. 53, 27 p. (2022; Zbl 1490.60268) Full Text: DOI arXiv
Bhamidi, Shankar; Dhara, Souvik; van der Hofstad, Remco; Sen, Sanchayan Universality for critical heavy-tailed network models: metric structure of maximal components. (English) Zbl 1445.60015 Electron. J. Probab. 25, Paper No. 47, 57 p. (2020). Reviewer: V. Yegnanarayanan (Chennai) MSC: 60C05 05C80 PDFBibTeX XMLCite \textit{S. Bhamidi} et al., Electron. J. Probab. 25, Paper No. 47, 57 p. (2020; Zbl 1445.60015) Full Text: DOI arXiv Euclid