Jirak, Moritz Edgeworth expansions for volatility models. (English) Zbl 07790271 Electron. J. Probab. 28, Paper No. 171, 18 p. (2023). MSC: 60F05 60F25 60G10 PDFBibTeX XMLCite \textit{M. Jirak}, Electron. J. Probab. 28, Paper No. 171, 18 p. (2023; Zbl 07790271) Full Text: DOI arXiv
Pakkanen, Mikko S.; Passeggeri, Riccardo; Sauri, Orimar; Veraart, Almut E. D. Limit theorems for trawl processes. (English) Zbl 1477.60057 Electron. J. Probab. 26, Paper No. 116, 36 p. (2021). Reviewer: Ivan Podvigin (Novosibirsk) MSC: 60F17 60G10 60G57 60J65 60G22 60G51 PDFBibTeX XMLCite \textit{M. S. Pakkanen} et al., Electron. J. Probab. 26, Paper No. 116, 36 p. (2021; Zbl 1477.60057) Full Text: DOI arXiv
Talarczyk, Anna; Treszczotko, Łukasz Limit theorems for integrated trawl processes with symmetric Lévy bases. (English) Zbl 1469.60150 Electron. J. Probab. 25, Paper No. 117, 24 p. (2020). MSC: 60G51 60F17 60F05 60G52 60G18 60G57 PDFBibTeX XMLCite \textit{A. Talarczyk} and \textit{Ł. Treszczotko}, Electron. J. Probab. 25, Paper No. 117, 24 p. (2020; Zbl 1469.60150) Full Text: DOI arXiv Euclid
Shen, Yandi; Han, Fang; Witten, Daniela Exponential inequalities for dependent V-statistics via random Fourier features. (English) Zbl 1461.60017 Electron. J. Probab. 25, Paper No. 7, 18 p. (2020). Reviewer: Fraser Daly (Edinburgh) MSC: 60E15 60F05 60F17 PDFBibTeX XMLCite \textit{Y. Shen} et al., Electron. J. Probab. 25, Paper No. 7, 18 p. (2020; Zbl 1461.60017) Full Text: DOI arXiv Euclid