Hwang, Eunju Weak convergence for stationary bootstrap empirical processes of associated sequences. (English) Zbl 1469.62244 J. Korean Math. Soc. 58, No. 1, 237-264 (2021). MSC: 62G09 62G20 60F15 60G15 PDFBibTeX XMLCite \textit{E. Hwang}, J. Korean Math. Soc. 58, No. 1, 237--264 (2021; Zbl 1469.62244) Full Text: DOI
Hwang, Eunju; Shin, Dong Wan Kernel estimators of mode under \(\psi\)-weak dependence. (English) Zbl 1440.62121 Ann. Inst. Stat. Math. 68, No. 2, 301-327 (2016). MSC: 62G07 62G20 62P20 PDFBibTeX XMLCite \textit{E. Hwang} and \textit{D. W. Shin}, Ann. Inst. Stat. Math. 68, No. 2, 301--327 (2016; Zbl 1440.62121) Full Text: DOI
Hwang, Eunju; Shin, Dong Wan Infinite-order, long-memory heterogeneous autoregressive models. (English) Zbl 1506.62086 Comput. Stat. Data Anal. 76, 339-358 (2014). MSC: 62-08 62M10 62F12 62P05 62P20 PDFBibTeX XMLCite \textit{E. Hwang} and \textit{D. W. Shin}, Comput. Stat. Data Anal. 76, 339--358 (2014; Zbl 1506.62086) Full Text: DOI
Hwang, Eunju; Shin, Dong Wan Block bootstrapping for kernel density estimators under {\(\psi\)}-weak dependence. (English) Zbl 1302.62093 Commun. Stat., Theory Methods 43, No. 17, 3751-3761 (2014). MSC: 62G08 62M05 62F40 PDFBibTeX XMLCite \textit{E. Hwang} and \textit{D. W. Shin}, Commun. Stat., Theory Methods 43, No. 17, 3751--3761 (2014; Zbl 1302.62093) Full Text: DOI
Hwang, Eunju The stationary bootstrap for the joint distribution of sum and maximum of stationary sequences. (English) Zbl 1306.62102 J. Korean Stat. Soc. 43, No. 2, 225-233 (2014). MSC: 62G09 60G10 62E20 PDFBibTeX XMLCite \textit{E. Hwang}, J. Korean Stat. Soc. 43, No. 2, 225--233 (2014; Zbl 1306.62102) Full Text: DOI
Hwang, Eunju; Shin, Dong Wan Stationary bootstrapping realized volatility. (English) Zbl 1279.62101 Stat. Probab. Lett. 83, No. 9, 2045-2051 (2013). MSC: 62G09 60G10 62E20 65C05 PDFBibTeX XMLCite \textit{E. Hwang} and \textit{D. W. Shin}, Stat. Probab. Lett. 83, No. 9, 2045--2051 (2013; Zbl 1279.62101) Full Text: DOI
Hwang, Eunju; Shin, Dong Wan Stationary bootstrapping realized volatility under market microstructure noise. (English) Zbl 1273.62249 Electron. J. Stat. 7, 2032-2053 (2013). MSC: 62P05 62G09 62P20 PDFBibTeX XMLCite \textit{E. Hwang} and \textit{D. W. Shin}, Electron. J. Stat. 7, 2032--2053 (2013; Zbl 1273.62249) Full Text: DOI Euclid
Hwang, Eunju; Shin, Dong Wan Random central limit theorems for linear processes with weakly dependent innovations. (English) Zbl 1296.60057 J. Korean Stat. Soc. 41, No. 3, 313-322 (2012). MSC: 60F05 62E20 PDFBibTeX XMLCite \textit{E. Hwang} and \textit{D. W. Shin}, J. Korean Stat. Soc. 41, No. 3, 313--322 (2012; Zbl 1296.60057) Full Text: DOI
Hwang, Eunju; Shin, Dong Wan Stationary bootstrap for kernel density estimators under \(\psi\)-weak dependence. (English) Zbl 1243.62060 Comput. Stat. Data Anal. 56, No. 6, 1581-1593 (2012). MSC: 62G09 62G07 62M10 65C05 62P05 PDFBibTeX XMLCite \textit{E. Hwang} and \textit{D. W. Shin}, Comput. Stat. Data Anal. 56, No. 6, 1581--1593 (2012; Zbl 1243.62060) Full Text: DOI
Hwang, Eunju; Shin, Dong Wan Strong consistency of the stationary bootstrap under \(\psi\)-weak dependence. (English) Zbl 1408.62083 Stat. Probab. Lett. 82, No. 3, 488-495 (2012). MSC: 62G09 62M09 60G10 PDFBibTeX XMLCite \textit{E. Hwang} and \textit{D. W. Shin}, Stat. Probab. Lett. 82, No. 3, 488--495 (2012; Zbl 1408.62083) Full Text: DOI
Hwang, Eunju; Shin, Dong Wan Semiparametric estimation for partially linear models with \(\psi\)-weak dependent errors. (English) Zbl 1296.62120 J. Korean Stat. Soc. 40, No. 4, 411-424 (2011). MSC: 62H12 62G20 62E20 PDFBibTeX XMLCite \textit{E. Hwang} and \textit{D. W. Shin}, J. Korean Stat. Soc. 40, No. 4, 411--424 (2011; Zbl 1296.62120) Full Text: DOI
Hwang, Eunju; Shin, Dong Wan Stationary bootstrapping for non-parametric estimator of nonlinear autoregressive model. (English) Zbl 1290.62077 J. Time Ser. Anal. 32, No. 3, 292-303 (2011). MSC: 62M10 62G05 62G08 62F40 62M05 PDFBibTeX XMLCite \textit{E. Hwang} and \textit{D. W. Shin}, J. Time Ser. Anal. 32, No. 3, 292--303 (2011; Zbl 1290.62077) Full Text: DOI