Cole, E. A. B. Integral evaluation in semiconductor device modelling using simulated annealing with Bose-Einstein statistics. (English) Zbl 1203.82110 Int. J. Numer. Model. 20, No. 4, 197-215 (2007). MSC: 82D37 68T05 90C59 82-08 65D20 82C10 78A40 PDFBibTeX XMLCite \textit{E. A. B. Cole}, Int. J. Numer. Model. 20, No. 4, 197--215 (2007; Zbl 1203.82110) Full Text: DOI
Górecki, Krzysztof Electrothermal compact model of CoolSET voltage regulators for SPICE. (English) Zbl 1117.78323 Int. J. Numer. Model. 20, No. 4, 181-195 (2007). MSC: 78A55 PDFBibTeX XMLCite \textit{K. Górecki}, Int. J. Numer. Model. 20, No. 4, 181--195 (2007; Zbl 1117.78323) Full Text: DOI
Balac, S.; Caloz, G. The reduced scalar potential in regions with permeable materials: reasons for loss of accuracy and cancellation. (English) Zbl 1139.78002 Int. J. Numer. Model. 20, No. 4, 163-180 (2007). Reviewer: Bogdan G. Nita (Upper Montclair) MSC: 78A30 78M25 PDFBibTeX XMLCite \textit{S. Balac} and \textit{G. Caloz}, Int. J. Numer. Model. 20, No. 4, 163--180 (2007; Zbl 1139.78002) Full Text: DOI HAL