Chen, Chan-Fu Robustness aspects of score tests for generalized linear and partially linear regression models. (English) Zbl 0614.62041 Technometrics 27, 277-283 (1985). Reviewer: H.Büning MSC: 62F35 62J05 62F03 PDFBibTeX XMLCite \textit{C.-F. Chen}, Technometrics 27, 277--283 (1985; Zbl 0614.62041) Full Text: DOI
Brown, Philip J.; Rundell, Peter W. K. Kernel estimates for categorical data. (English) Zbl 0611.62058 Technometrics 27, 293-299 (1985). MSC: 62H12 62H30 62H17 62G05 PDFBibTeX XMLCite \textit{P. J. Brown} and \textit{P. W. K. Rundell}, Technometrics 27, 293--299 (1985; Zbl 0611.62058) Full Text: DOI
Gorman, John W.; Cornell, John A. A note on fitting equations to freezing-point data exhibiting eutectics for binary and ternary mixture systems. (English) Zbl 0609.62153 Technometrics 27, 229-239 (1985). MSC: 62P99 80A17 80A99 PDFBibTeX XMLCite \textit{J. W. Gorman} and \textit{J. A. Cornell}, Technometrics 27, 229--239 (1985; Zbl 0609.62153) Full Text: DOI
Wong, Audrey; Meeker, Jeff B.; Selwyn, Murray R. Screening on correlated variables: A Bayesian approach. (English) Zbl 0609.62138 Technometrics 27, 423-431 (1985). MSC: 62P10 62F15 PDFBibTeX XMLCite \textit{A. Wong} et al., Technometrics 27, 423--431 (1985; Zbl 0609.62138) Full Text: DOI
Vardeman, Stephen; Ray, Di-ou Average run lengths for CUSUM schemes when observations are exponentially distributed. (English) Zbl 0605.62116 Technometrics 27, 145-150 (1985). MSC: 62P30 PDFBibTeX XMLCite \textit{S. Vardeman} and \textit{D.-o. Ray}, Technometrics 27, 145--150 (1985; Zbl 0605.62116) Full Text: DOI
Bates, Douglas M.; Watts, Donald G. Multiresponse estimation with special application to linear systems of differential equations. (English) Zbl 0599.93052 Technometrics 27, 329-360 (1985). Reviewer: E.Gilbo MSC: 93E10 49M15 93C05 62F25 93E25 PDFBibTeX XMLCite \textit{D. M. Bates} and \textit{D. G. Watts}, Technometrics 27, 329--360 (1985; Zbl 0599.93052) Full Text: DOI
Hamilton, David C.; Watts, Donald G. A quadratic design criterion for precise estimation in nonlinear regression models. (English) Zbl 0598.62083 Technometrics 27, 241-250 (1985). Reviewer: A.M.Kshirsagar MSC: 62K05 62J02 PDFBibTeX XMLCite \textit{D. C. Hamilton} and \textit{D. G. Watts}, Technometrics 27, 241--250 (1985; Zbl 0598.62083) Full Text: DOI
Woodall, William H.; Ncube, Matoteng M. Multivariate CUSUM quality-control procedures. (English) Zbl 0595.62106 Technometrics 27, 285-292 (1985). Reviewer: W.Uhlmann MSC: 62P30 PDFBibTeX XMLCite \textit{W. H. Woodall} and \textit{M. M. Ncube}, Technometrics 27, 285--292 (1985; Zbl 0595.62106) Full Text: DOI
Piepel, Gregory F.; Cornell, John A. Models for mixture experiments when the response depends on the total amount. (English) Zbl 0588.62132 Technometrics 27, 219-227 (1985). MSC: 62K99 PDFBibTeX XMLCite \textit{G. F. Piepel} and \textit{J. A. Cornell}, Technometrics 27, 219--227 (1985; Zbl 0588.62132) Full Text: DOI
Suzuki, Kazuyuki Estimation of lifetime parameters from incomplete field data. (English) Zbl 0586.62157 Technometrics 27, 263-271 (1985). MSC: 62N05 PDFBibTeX XMLCite \textit{K. Suzuki}, Technometrics 27, 263--271 (1985; Zbl 0586.62157) Full Text: DOI
Arcelus, F. J.; Banerjee, P. K. Selection of the most economical production plan in a tool-wear process. (English) Zbl 0585.62172 Technometrics 27, 433-437 (1985). MSC: 62P30 90B30 90C30 PDFBibTeX XMLCite \textit{F. J. Arcelus} and \textit{P. K. Banerjee}, Technometrics 27, 433--437 (1985; Zbl 0585.62172) Full Text: DOI
Draper, Norman R. Small composite designs. (English) Zbl 0576.62082 Technometrics 27, 173-180 (1985). MSC: 62K15 62K99 PDFBibTeX XMLCite \textit{N. R. Draper}, Technometrics 27, 173--180 (1985; Zbl 0576.62082) Full Text: DOI
Jones, Robert A.; Scholz, F. W.; Ossiander, Mina; Shorack, Galen R. Tolerance bounds for log gamma regression models. (English) Zbl 0573.62093 Technometrics 27, 109-118 (1985). MSC: 62N05 62Q05 62F25 62J05 PDFBibTeX XMLCite \textit{R. A. Jones} et al., Technometrics 27, 109--118 (1985; Zbl 0573.62093) Full Text: DOI
Schmee, Josef; Gladstein, David; Nelson, Wayne Confidence limits for parameters of a normal distribution from singly censored samples, using maximum likelihood. (English) Zbl 0572.62080 Technometrics 27, 119-128 (1985). MSC: 62N05 62Q05 62F25 PDFBibTeX XMLCite \textit{J. Schmee} et al., Technometrics 27, 119--128 (1985; Zbl 0572.62080) Full Text: DOI
Lucas, James M. Counted data CUSUM’s. (English) Zbl 0571.62090 Technometrics 27, 129-144 (1985). MSC: 62P30 62Q05 PDFBibTeX XMLCite \textit{J. M. Lucas}, Technometrics 27, 129--144 (1985; Zbl 0571.62090) Full Text: DOI
Franklin, M. F. Selecting defining contrasts and confounded effects in \(p^{n-m}\) factorial experiments. (English) Zbl 0571.62066 Technometrics 27, 165-172 (1985). MSC: 62K15 PDFBibTeX XMLCite \textit{M. F. Franklin}, Technometrics 27, 165--172 (1985; Zbl 0571.62066) Full Text: DOI
Narula, Subhash C.; Wellington, John F. Interior analysis for the minimum sum of absolute errors regression. (English) Zbl 0571.62060 Technometrics 27, 181-188 (1985). MSC: 62J05 PDFBibTeX XMLCite \textit{S. C. Narula} and \textit{J. F. Wellington}, Technometrics 27, 181--188 (1985; Zbl 0571.62060) Full Text: DOI
Hampel, Frank R. The breakdown points of the mean combined with some rejection rules. (English) Zbl 0571.62030 Technometrics 27, 95-107 (1985). MSC: 62F35 65C05 62-07 PDFBibTeX XMLCite \textit{F. R. Hampel}, Technometrics 27, 95--107 (1985; Zbl 0571.62030) Full Text: DOI
Nigam, A. K.; Gupta, V. K. Construction of orthogonal main-effect plans using Hadamard matrices. (English) Zbl 0562.62069 Technometrics 27, 37-40 (1985). MSC: 62K15 05B20 PDFBibTeX XMLCite \textit{A. K. Nigam} and \textit{V. K. Gupta}, Technometrics 27, 37--40 (1985; Zbl 0562.62069) Full Text: DOI
Borth, David M.; McKay, Robert J.; Elliott, J. Richard A difficulty information approach to substituent selection in QSAR studies. (English) Zbl 0559.62092 Technometrics 27, 25-35 (1985). MSC: 62P10 62K05 62P99 62B10 PDFBibTeX XMLCite \textit{D. M. Borth} et al., Technometrics 27, 25--35 (1985; Zbl 0559.62092) Full Text: DOI
Schwetlick, Hubert; Tiller, Volker Numerical methods for estimating parameters in nonlinear models with errors in the variables. (English) Zbl 0559.62052 Technometrics 27, 17-24 (1985). MSC: 62J02 65C99 65D10 65K05 PDFBibTeX XMLCite \textit{H. Schwetlick} and \textit{V. Tiller}, Technometrics 27, 17--24 (1985; Zbl 0559.62052) Full Text: DOI
Williams, William W.; Looney, Stephen W.; Peters, Michael H. Use of curtailed sampling plans in the economic design of np-control charts. (English) Zbl 0558.62086 Technometrics 27, 57-63 (1985). MSC: 62P30 PDFBibTeX XMLCite \textit{W. W. Williams} et al., Technometrics 27, 57--63 (1985; Zbl 0558.62086) Full Text: DOI
Sandford, Martin D. Nonparametric one-sided confidence intervals for an unknown distribution function using censored data. (English) Zbl 0558.62041 Technometrics 27, 41-48 (1985). MSC: 62G15 62Q05 PDFBibTeX XMLCite \textit{M. D. Sandford}, Technometrics 27, 41--48 (1985; Zbl 0558.62041) Full Text: DOI
Carroll, R. J.; Ruppert, David Transformations in regression: A robust analysis. (English) Zbl 0558.62032 Technometrics 27, 1-12 (1985). MSC: 62F35 62J05 PDFBibTeX XMLCite \textit{R. J. Carroll} and \textit{D. Ruppert}, Technometrics 27, 1--12 (1985; Zbl 0558.62032) Full Text: DOI