Felgenhauer, F.; Begoin, M.; Mathis, W. Analysis of parasitic quantum effects in classical CMOS circuits. (English) Zbl 1100.82022 Int. J. Numer. Model. 18, No. 4, 313-323 (2005). Reviewer: Michael Baro (Berlin) MSC: 82C70 65Z05 94C05 82D37 PDFBibTeX XMLCite \textit{F. Felgenhauer} et al., Int. J. Numer. Model. 18, No. 4, 313--323 (2005; Zbl 1100.82022) Full Text: DOI
Yeddes, M.; Kaddour, M.; Gharsallah, A.; Gharbi, A. Analysis of DGS structures by using the iterative method. (English) Zbl 1069.78009 Int. J. Numer. Model. 18, No. 4, 297-311 (2005). MSC: 78A55 78M25 PDFBibTeX XMLCite \textit{M. Yeddes} et al., Int. J. Numer. Model. 18, No. 4, 297--311 (2005; Zbl 1069.78009) Full Text: DOI
Parvais, B.; Cerdeira, A.; Schreurs, D.; Raskin, J.-P. Non-linear performance comparison for FD and PD SOI MOSFETs based on the integral function method and Volterra modelling. (English) Zbl 1068.78510 Int. J. Numer. Model. 18, No. 4, 283-296 (2005). MSC: 78A55 PDFBibTeX XMLCite \textit{B. Parvais} et al., Int. J. Numer. Model. 18, No. 4, 283--296 (2005; Zbl 1068.78510) Full Text: DOI
van Niekerk, Cornell; Schreurs, Dominique A new adaptive multi-bias \(S\)-parameter measurement algorithm for transistor characterization. (English) Zbl 1068.78505 Int. J. Numer. Model. 18, No. 4, 267-281 (2005). MSC: 78A45 78-05 PDFBibTeX XMLCite \textit{C. van Niekerk} and \textit{D. Schreurs}, Int. J. Numer. Model. 18, No. 4, 267--281 (2005; Zbl 1068.78505) Full Text: DOI
Itoh, Nobuyuki; Kojima, Kenji; Ohguro, Tatsuya Journal home. (English) Zbl 1068.78509 Int. J. Numer. Model. 18, No. 4, 255-266 (2005). MSC: 78A55 PDFBibTeX XMLCite \textit{N. Itoh} et al., Int. J. Numer. Model. 18, No. 4, 255--266 (2005; Zbl 1068.78509) Full Text: DOI