Edelvik, F.; Schuhmann, R.; Weiland, T. A general stability analysis of FIT/FDTD applied to lossy dielectrics and lumped elements. (English) Zbl 1054.78029 Int. J. Numer. Model. 17, No. 4, 407-419 (2004). Reviewer: Iulian Coroian (Baia Mare) MSC: 78M20 78M25 PDFBibTeX XMLCite \textit{F. Edelvik} et al., Int. J. Numer. Model. 17, No. 4, 407--419 (2004; Zbl 1054.78029) Full Text: DOI
Igic, P. M.; Towers, M. S.; Mawby, P. A. Physically based 2D compact model for power bipolar devices. (English) Zbl 1074.35551 Int. J. Numer. Model. 17, No. 4, 397-405 (2004). Reviewer: S. Burys (Kraków) MSC: 35K05 35K20 PDFBibTeX XMLCite \textit{P. M. Igic} et al., Int. J. Numer. Model. 17, No. 4, 397--405 (2004; Zbl 1074.35551) Full Text: DOI
Nafeh, Abd El-Shafy A. Evaluation of the optimum tilt of a PV array using maximum global insolation technique. (English) Zbl 1049.78507 Int. J. Numer. Model. 17, No. 4, 385-395 (2004). MSC: 78A55 PDFBibTeX XMLCite \textit{A. E. S. A. Nafeh}, Int. J. Numer. Model. 17, No. 4, 385--395 (2004; Zbl 1049.78507) Full Text: DOI
Edelvik, F.; Weiland, T. Stable modelling of arbitrary thin slots in the finite-element time-domain method. (English) Zbl 1057.78012 Int. J. Numer. Model. 17, No. 4, 365-383 (2004). Reviewer: Eric Sonnendrücker (Strasbourg) MSC: 78M10 78A55 PDFBibTeX XMLCite \textit{F. Edelvik} and \textit{T. Weiland}, Int. J. Numer. Model. 17, No. 4, 365--383 (2004; Zbl 1057.78012) Full Text: DOI
El-Masri, Samir Analysis of discontinuities in rectangular ducts and higher order mode excitations using TLM and FEM methods. (English) Zbl 1288.76042 Int. J. Numer. Model. 17, No. 4, 353-364 (2004). MSC: 76M10 76M25 76Q05 PDFBibTeX XMLCite \textit{S. El-Masri}, Int. J. Numer. Model. 17, No. 4, 353--364 (2004; Zbl 1288.76042) Full Text: DOI
Cole, E. A. B. The phase plane method for the solution of equations applied to semiconductor device modelling. (English) Zbl 1056.78016 Int. J. Numer. Model. 17, No. 4, 335-352 (2004). Reviewer: Alan Jeffrey (Newcastle upon Tyne) MSC: 78M25 PDFBibTeX XMLCite \textit{E. A. B. Cole}, Int. J. Numer. Model. 17, No. 4, 335--352 (2004; Zbl 1056.78016) Full Text: DOI