Jane, Chin-Chia; Laih, Yih-Wenn Evaluating cost and reliability integrated performance of stochastic logistics systems. (English) Zbl 1407.90056 Nav. Res. Logist. 59, No. 7, 577-586 (2012). MSC: 90B06 90B25 90B15 PDFBibTeX XMLCite \textit{C.-C. Jane} and \textit{Y.-W. Laih}, Nav. Res. Logist. 59, No. 7, 577--586 (2012; Zbl 1407.90056) Full Text: DOI
Li, Hongmin; Huh, Woonghee Tim Optimal pricing for a short life-cycle product when customer price-sensitivity varies over time. (English) Zbl 1407.91115 Nav. Res. Logist. 59, No. 7, 552-576 (2012). MSC: 91B24 91B42 90B05 PDFBibTeX XMLCite \textit{H. Li} and \textit{W. T. Huh}, Nav. Res. Logist. 59, No. 7, 552--576 (2012; Zbl 1407.91115) Full Text: DOI
Guo, Hangfei; Leng, Mingming; Wang, Yulan Interchange fee rate, merchant discount rate, and retail price in a credit card network: a game-theoretic analysis. (English) Zbl 1407.91074 Nav. Res. Logist. 59, No. 7, 525-551 (2012). MSC: 91A80 91A40 91A12 PDFBibTeX XMLCite \textit{H. Guo} et al., Nav. Res. Logist. 59, No. 7, 525--551 (2012; Zbl 1407.91074) Full Text: DOI Link
Tang, Lixin; Zhao, Ren; Liu, Jiyin Models and algorithms for shuffling problems in steel plants. (English) Zbl 1407.90233 Nav. Res. Logist. 59, No. 7, 502-524 (2012). MSC: 90B90 90B06 90B30 90C10 90C59 PDFBibTeX XMLCite \textit{L. Tang} et al., Nav. Res. Logist. 59, No. 7, 502--524 (2012; Zbl 1407.90233) Full Text: DOI
Ou, Jinwen Economic lot sizing with constant capacities and concave inventory costs. (English) Zbl 1407.90030 Nav. Res. Logist. 59, No. 7, 497-501 (2012). MSC: 90B05 90C39 PDFBibTeX XMLCite \textit{J. Ou}, Nav. Res. Logist. 59, No. 7, 497--501 (2012; Zbl 1407.90030) Full Text: DOI
Navarro, Jorge; Ng, Hon Keung Tony; Balakrishnan, Narayanaswamy Parametric inference for component distributions from lifetimes of systems with dependent components. (English) Zbl 1407.62377 Nav. Res. Logist. 59, No. 7, 487-496 (2012). MSC: 62N05 90B25 62F10 PDFBibTeX XMLCite \textit{J. Navarro} et al., Nav. Res. Logist. 59, No. 7, 487--496 (2012; Zbl 1407.62377) Full Text: DOI