Satyala, Nikhil T.; Pieper, R. J. A unified approach for predicting long- and short-term capability indices with dependence on manufacturing target bias. (English) Zbl 1202.62190 Int. J. Qual. Stat. Reliab. 2008, Article ID 594753, 10 p. (2008). MSC: 62P30 62M20 PDFBibTeX XMLCite \textit{N. T. Satyala} and \textit{R. J. Pieper}, Int. J. Qual. Stat. Reliab. 2008, Article ID 594753, 10 p. (2008; Zbl 1202.62190) Full Text: DOI
Hussain, Jassim N. Sensitivity analysis to select the most influential risk factors in a logistic regression model. (English) Zbl 1202.62138 Int. J. Qual. Stat. Reliab. 2008, Article ID 471607, 10 p. (2008). MSC: 62N99 62J12 62P10 PDFBibTeX XMLCite \textit{J. N. Hussain}, Int. J. Qual. Stat. Reliab. 2008, Article ID 471607, 10 p. (2008; Zbl 1202.62138) Full Text: DOI