Kim, Choongrak; Storer, Barry E.; Jeong, Meeseon A note on Box-Cox transformation diagnostics. (English) Zbl 0874.62076 Technometrics 38, No. 2, 178-180 (1996). MSC: 62J20 62J05 PDF BibTeX XML Cite \textit{C. Kim} et al., Technometrics 38, No. 2, 178--180 (1996; Zbl 0874.62076) Full Text: DOI
Lamb, R. H.; Boos, Dennis D.; Brownie, Cavell Testing for effects on variance in experiments with factorial treatment structure and nested errors. (English) Zbl 0871.62065 Technometrics 38, No. 2, 170-177 (1996). MSC: 62K15 62P30 62J10 PDF BibTeX XML Cite \textit{R. H. Lamb} et al., Technometrics 38, No. 2, 170--177 (1996; Zbl 0871.62065) Full Text: DOI
Venter, J. H.; Steel, S. J. A hypothesis-testing approach toward identifying active contrasts. (English) Zbl 0871.62066 Technometrics 38, No. 2, 161-169 (1996). MSC: 62K15 62F03 PDF BibTeX XML Cite \textit{J. H. Venter} and \textit{S. J. Steel}, Technometrics 38, No. 2, 161--169 (1996; Zbl 0871.62066) Full Text: DOI
Tatum, Lawrence G. Control charts for the detection of a periodic component. (English) Zbl 0871.62086 Technometrics 38, No. 2, 152-160 (1996). MSC: 62P30 62M15 PDF BibTeX XML Cite \textit{L. G. Tatum}, Technometrics 38, No. 2, 152--160 (1996; Zbl 0871.62086) Full Text: DOI
Vander Wiel, S. A. Monitoring processes that wander using integrated moving average models. (English) Zbl 0871.62087 Technometrics 38, No. 2, 139-151 (1996). MSC: 62P30 PDF BibTeX XML Cite \textit{S. A. Vander Wiel}, Technometrics 38, No. 2, 139--151 (1996; Zbl 0871.62087) Full Text: DOI
Lawless, J. F.; Thiagarajah, K. A point-process model incorporating renewals and time trends, with application to repairable systems. (English) Zbl 0870.62075 Technometrics 38, No. 2, 131-138 (1996). MSC: 62N05 60K10 PDF BibTeX XML Cite \textit{J. F. Lawless} and \textit{K. Thiagarajah}, Technometrics 38, No. 2, 131--138 (1996; Zbl 0870.62075) Full Text: DOI
Olin, Bryan D.; Meeker, William Q. Applications of statistical methods to nondestructive evaluation. (With discussion). (English) Zbl 0870.62080 Technometrics 38, No. 2, 95-130 (1996). MSC: 62P30 62N99 PDF BibTeX XML Cite \textit{B. D. Olin} and \textit{W. Q. Meeker}, Technometrics 38, No. 2, 95--130 (1996; Zbl 0870.62080) Full Text: DOI