Chipot, Michel; Lee, Kyounghun; Seo, Jin Keun Mathematical model of conductive fabric-based flexible pressure sensor. (English) Zbl 1480.78014 Appl. Math. Modelling 48, 775-786 (2017). MSC: 78A48 74M05 PDF BibTeX XML Cite \textit{M. Chipot} et al., Appl. Math. Modelling 48, 775--786 (2017; Zbl 1480.78014) Full Text: DOI OpenURL
Ammari, Habib; Giovangigli, Laure; Kwon, Hyeuknam; Seo, Jin-Keun; Wintz, Timothée Spectroscopic conductivity imaging of a cell culture. (English) Zbl 1356.35259 Asymptotic Anal. 100, No. 1-2, 87-109 (2016). MSC: 35Q92 92C37 92C55 35R30 78A70 35P99 PDF BibTeX XML Cite \textit{H. Ammari} et al., Asymptotic Anal. 100, No. 1--2, 87--109 (2016; Zbl 1356.35259) Full Text: DOI OpenURL
Ammari, Habib; Seo, Jin Keun; Zhang, Tingting Mathematical framework for multi-frequency identification of thin insulating and small conductive inhomogeneities. (English) Zbl 1431.65204 Inverse Probl. 32, No. 10, Article ID 105001, 23 p. (2016). MSC: 65N21 78A48 PDF BibTeX XML Cite \textit{H. Ammari} et al., Inverse Probl. 32, No. 10, Article ID 105001, 23 p. (2016; Zbl 1431.65204) Full Text: DOI arXiv OpenURL
Ammari, Habib; Kwon, Hyeuknam; Lee, Yoonseop; Kang, Kyungkeun; Seo, Jin Keun Magnetic resonance-based reconstruction method of conductivity and permittivity distributions at the Larmor frequency. (English) Zbl 1330.78014 Inverse Probl. 31, No. 10, Article ID 105001, 24 p. (2015). MSC: 78A48 92C55 PDF BibTeX XML Cite \textit{H. Ammari} et al., Inverse Probl. 31, No. 10, Article ID 105001, 24 p. (2015; Zbl 1330.78014) Full Text: DOI arXiv OpenURL
Ammari, Habib; Kang, Kyungkeun; Lee, Kyounghun; Seo, Jin Keun A pressure distribution imaging technique with a conductive membrane using electrical impedance tomography. (English) Zbl 1328.35298 SIAM J. Appl. Math. 75, No. 4, 1493-1512 (2015). MSC: 35R30 35J25 78A55 PDF BibTeX XML Cite \textit{H. Ammari} et al., SIAM J. Appl. Math. 75, No. 4, 1493--1512 (2015; Zbl 1328.35298) Full Text: DOI arXiv OpenURL
Ammari, Habib; Lee, Eunjung; Kwon, Hyeuknam; Seo, Jin Keun; Woo, Eung Je Mathematical modeling of mechanical vibration-assisted conductivity imaging. (English) Zbl 1432.35240 SIAM J. Appl. Math. 75, No. 3, 1031-1046 (2015). MSC: 35R30 35B30 92C55 78A46 PDF BibTeX XML Cite \textit{H. Ammari} et al., SIAM J. Appl. Math. 75, No. 3, 1031--1046 (2015; Zbl 1432.35240) Full Text: DOI arXiv OpenURL
Seo, Jin Keun; Kim, Dong-Hyun; Lee, Joonsung; Kwon, Oh In; Sajib, Saurav Z. K.; Woo, Eung Je Electrical tissue property imaging using MRI at DC and Larmor frequency. (English) Zbl 1252.92039 Inverse Probl. 28, No. 8, Article ID 084002, 26 p. (2012). MSC: 92C55 78A70 92C05 35Q92 PDF BibTeX XML Cite \textit{J. K. Seo} et al., Inverse Probl. 28, No. 8, Article ID 084002, 26 p. (2012; Zbl 1252.92039) Full Text: DOI OpenURL
Kim, Sungwhan; Lee, Eun Jung; Woo, Eung Je; Seo, Jin Keun Asymptotic analysis of the membrane structure to sensitivity of frequency-difference electrical impedance tomography. (English) Zbl 1344.78013 Inverse Probl. 28, No. 7, Article ID 075004, 17 p. (2012). MSC: 78A46 78M35 92C55 35Q60 PDF BibTeX XML Cite \textit{S. Kim} et al., Inverse Probl. 28, No. 7, Article ID 075004, 17 p. (2012; Zbl 1344.78013) Full Text: DOI OpenURL
Seo, Jin Keun; Jeon, Kiwan; Lee, Chang-Ock; Woo, Eung Je Non-iterative harmonic \(B_{z}\) algorithm in MREIT. (English) Zbl 1235.78028 Inverse Probl. 27, No. 8, Article ID 085003, 12 p. (2011). Reviewer: Witold Pedrycz (Edmonton) MSC: 78A55 PDF BibTeX XML Cite \textit{J. K. Seo} et al., Inverse Probl. 27, No. 8, Article ID 085003, 12 p. (2011; Zbl 1235.78028) Full Text: DOI OpenURL
Song, Yizhuang; Lee, Eunjung; Woo, Eung Je; Seo, Jin Keun Optimal geometry toward uniform current density electrodes. (English) Zbl 1227.78018 Inverse Probl. 27, No. 7, Article ID 075004, 17 p. (2011). MSC: 78A70 78M50 PDF BibTeX XML Cite \textit{Y. Song} et al., Inverse Probl. 27, No. 7, Article ID 075004, 17 p. (2011; Zbl 1227.78018) Full Text: DOI OpenURL
Lee, Eunjung; Seo, Jin Keun; Woo, Eung Je; Zhang, Tingting Mathematical framework for a new microscopic electrical impedance tomography system. (English) Zbl 1217.35212 Inverse Probl. 27, No. 5, Article ID 055008, 19 p. (2011). MSC: 35R30 78A46 92C55 65N21 PDF BibTeX XML Cite \textit{E. Lee} et al., Inverse Probl. 27, No. 5, Article ID 055008, 19 p. (2011; Zbl 1217.35212) Full Text: DOI Link OpenURL
Seo, Jin Keun; Woo, Eung Je Magnetic resonance electrical impedance tomography (MREIT). (English) Zbl 1210.35293 SIAM Rev. 53, No. 1, 40-68 (2011). MSC: 35R30 35J05 76Q05 78A70 78A46 35-02 78-02 PDF BibTeX XML Cite \textit{J. K. Seo} and \textit{E. J. Woo}, SIAM Rev. 53, No. 1, 40--68 (2011; Zbl 1210.35293) Full Text: DOI OpenURL
Harrach, Bastian; Seo, Jin Keun Exact shape-reconstruction by one-step linearization in electrical impedance tomography. (English) Zbl 1215.35167 SIAM J. Math. Anal. 42, No. 4, 1505-1518 (2010). MSC: 35R30 35Q60 35J25 35R05 78A46 35A35 PDF BibTeX XML Cite \textit{B. Harrach} and \textit{J. K. Seo}, SIAM J. Math. Anal. 42, No. 4, 1505--1518 (2010; Zbl 1215.35167) Full Text: DOI Link Link OpenURL
Liu, Jijun; Seo, Jinkeun; Woo, Eungje A posteriori error estimate and convergence analysis for conductivity image reconstruction in MREIT. (English) Zbl 1210.35290 SIAM J. Appl. Math. 70, No. 8, 2883-2903 (2010). MSC: 35R30 35J05 76Q05 78A46 92C55 PDF BibTeX XML Cite \textit{J. Liu} et al., SIAM J. Appl. Math. 70, No. 8, 2883--2903 (2010; Zbl 1210.35290) Full Text: DOI OpenURL
Woo, Hyenkyun; Kim, Sungwhan; Seo, Jin Keun Electrical capacitance tomography for visualizing the flow of a mixture of high/low conducting components. (English) Zbl 1197.78038 Inverse Probl. Sci. Eng. 18, No. 5, 691-709 (2010). MSC: 78A46 35R30 35J25 PDF BibTeX XML Cite \textit{H. Woo} et al., Inverse Probl. Sci. Eng. 18, No. 5, 691--709 (2010; Zbl 1197.78038) Full Text: DOI OpenURL
Kim, Sungwhan; Seo, Jin Keun; Ha, Taeyoung A nondestructive evaluation method for concrete voids: frequency differential electrical impedance scanning. (English) Zbl 1180.35566 SIAM J. Appl. Math. 69, No. 6, 1759-1771 (2009). MSC: 35R30 65N21 78A46 PDF BibTeX XML Cite \textit{S. Kim} et al., SIAM J. Appl. Math. 69, No. 6, 1759--1771 (2009; Zbl 1180.35566) Full Text: DOI OpenURL
Harrach, Bastian; Seo, Jin Keun Detecting inclusions in electrical impedance tomography without reference measurements. (English) Zbl 1180.35561 SIAM J. Appl. Math. 69, No. 6, 1662-1681 (2009). MSC: 35R30 35Q60 35J25 35R05 78A46 78M25 65N21 PDF BibTeX XML Cite \textit{B. Harrach} and \textit{J. K. Seo}, SIAM J. Appl. Math. 69, No. 6, 1662--1681 (2009; Zbl 1180.35561) Full Text: DOI OpenURL
Seo, Jin Keun; Harrach, Bastian; Woo, Eung Je Recent progress on frequency difference electrical impedance tomography. (English) Zbl 1169.35395 ESAIM, Proc. 26, 150-161 (2009). MSC: 35R30 35J05 78A70 92C55 PDF BibTeX XML Cite \textit{J. K. Seo} et al., ESAIM, Proc. 26, 150--161 (2008; Zbl 1169.35395) Full Text: DOI OpenURL
Kim, Sungwhan; Lee, Jeehyun; Seo, Jin Keun; Woo, Eung Je; Zribi, Habib Multifrequency trans-admittance scanner: Mathematical framework and feasibility. (English) Zbl 1156.35102 SIAM J. Appl. Math. 69, No. 1, 22-36 (2008). MSC: 35R30 35A35 65N21 35C15 78A70 92C50 PDF BibTeX XML Cite \textit{S. Kim} et al., SIAM J. Appl. Math. 69, No. 1, 22--36 (2008; Zbl 1156.35102) Full Text: DOI OpenURL
Lee, Jeehyun; Seo, Jin Keun; Woo, Eung Je Mathematical framework for current density imaging due to discharge of electro-muscular disruption devices. (English) Zbl 1388.35197 ESAIM, Math. Model. Numer. Anal. 41, No. 3, 447-459 (2007). MSC: 35Q92 92C55 35Q60 78A55 93A30 35R30 PDF BibTeX XML Cite \textit{J. Lee} et al., ESAIM, Math. Model. Numer. Anal. 41, No. 3, 447--459 (2007; Zbl 1388.35197) Full Text: DOI Numdam EuDML OpenURL
Kwon, Ohin; Pyo, Hyunchan; Seo, Jin Keun; Woo, Eung Je Mathematical framework for \(B_{z}\)-based MREIT model in electrical impedance imaging. (English) Zbl 1134.92346 Comput. Math. Appl. 51, No. 5, 817-828 (2006). MSC: 92C55 78A70 35Q92 65N99 94A08 PDF BibTeX XML Cite \textit{O. Kwon} et al., Comput. Math. Appl. 51, No. 5, 817--828 (2006; Zbl 1134.92346) Full Text: DOI OpenURL
Liu, J. J.; Pyo, H. C.; Seo, J. K.; Woo, E. J. Convergence properties and stability issues in MREIT algorithm. (English) Zbl 1110.35105 Ammari, Habib (ed.) et al., Inverse problems, multi-scale analysis and effective medium theory. Proceedings of the workshop on inverse problems, multi-scale analysis and homogenization, Seoul, Korea, June 22–24, 2005. Providence, RI: American Mathematical Society (AMS) (ISBN 0-8218-3968-3/pbk). Contemporary Mathematics 408, 201-218 (2006). MSC: 35R30 92C55 35J25 78A46 65N21 PDF BibTeX XML Cite \textit{J. J. Liu} et al., Contemp. Math. 408, 201--218 (2006; Zbl 1110.35105) OpenURL
Liu, Jijun; Seo, Jinkeun On stability for a translated obstacle with impedance boundary condition. (English) Zbl 1062.35175 Nonlinear Anal., Theory Methods Appl., Ser. A, Theory Methods 59, No. 5, 731-744 (2004). MSC: 35R30 35J25 78A46 PDF BibTeX XML Cite \textit{J. Liu} and \textit{J. Seo}, Nonlinear Anal., Theory Methods Appl., Ser. A, Theory Methods 59, No. 5, 731--744 (2004; Zbl 1062.35175) Full Text: DOI OpenURL
Ammari, Habib; Kwon, Ohin; Seo, Jin Keun; Woo, Eung Je T-scan electrical impedance imaging system for anomaly detection. (English) Zbl 1075.35102 SIAM J. Appl. Math. 65, No. 1, 252-266 (2004). MSC: 35R30 65N21 78A30 78A70 35J25 92C50 PDF BibTeX XML Cite \textit{H. Ammari} et al., SIAM J. Appl. Math. 65, No. 1, 252--266 (2004; Zbl 1075.35102) Full Text: DOI OpenURL
Ammari, Habib; Seo, Jin Keun An accurate formula for the reconstruction of conductivity inhomogeneities. (English) Zbl 1040.78008 Adv. Appl. Math. 30, No. 4, 679-705 (2003). MSC: 78A46 35J25 35R30 78A55 PDF BibTeX XML Cite \textit{H. Ammari} and \textit{J. K. Seo}, Adv. Appl. Math. 30, No. 4, 679--705 (2003; Zbl 1040.78008) Full Text: DOI OpenURL
Kwon, Ohin; Seo, Jin Keun; Yoon, Jeong-Rock A real-time algorithm for the location search of discontinuous conductivities with one measurement. (English) Zbl 1032.78005 Commun. Pure Appl. Math. 55, No. 1, 1-29 (2002). Reviewer: Mithat Idemen (İstanbul) MSC: 78A30 35J25 35R30 78A46 78M25 PDF BibTeX XML Cite \textit{O. Kwon} et al., Commun. Pure Appl. Math. 55, No. 1, 1--29 (2002; Zbl 1032.78005) Full Text: DOI OpenURL
Kwon, Ohin; Seo, Jin Keun; Woo, Eung Je; Yoon, Jeong-Rock Magnetic resonance electrical impedance tomography. (English) Zbl 1101.78308 Commun. Korean Math. Soc. 16, No. 3, 519-541 (2001). MSC: 78A46 65R30 78A70 PDF BibTeX XML Cite \textit{O. Kwon} et al., Commun. Korean Math. Soc. 16, No. 3, 519--541 (2001; Zbl 1101.78308) Full Text: DOI OpenURL
Kwon, Ohin; Seo, Jin Keun; Woo, Eung Je; Yoon, Jeong-Rock Electrical impedance imaging for searching anomalies. (English) Zbl 1101.78307 Commun. Korean Math. Soc. 16, No. 3, 459-485 (2001). MSC: 78A46 35J25 35R30 62P30 65N21 78A70 PDF BibTeX XML Cite \textit{O. Kwon} et al., Commun. Korean Math. Soc. 16, No. 3, 459--485 (2001; Zbl 1101.78307) OpenURL