Li, Yonglong; Tan, Vincent Y. F. Second-order asymptotics of sequential hypothesis testing. (English) Zbl 1453.62612 IEEE Trans. Inf. Theory 66, No. 11, 7222-7230 (2020). Editorial remark: No review copy delivered. Cited in 1 Document MSC: 62L10 Sequential statistical analysis 62E20 Asymptotic distribution theory in statistics Keywords:sequential binary hypothesis testing problem; second-order asymptotics PDFBibTeX XMLCite \textit{Y. Li} and \textit{V. Y. F. Tan}, IEEE Trans. Inf. Theory 66, No. 11, 7222--7230 (2020; Zbl 1453.62612) Full Text: DOI arXiv