zbMATH — the first resource for mathematics

Isogeometric analysis. Toward integration of CAD and FEA. (English) Zbl 1378.65009
Hoboken, NJ: John Wiley & Sons (ISBN 978-0-470-74873-2/hbk; 978-0-470-74908-1/ebook). xvi, 335 p. (2009).
Publisher’s description: Written by leading experts in the field and featuring fully integrated colour throughout, Isogeometric Analysis provides a groundbreaking solution for the integration of CAD and FEA technologies. Tom Hughes and his researchers, Austin Cottrell and Yuri Bazilevs, present their pioneering isogeometric approach, which aims to integrate the two techniques of CAD and FEA using precise NURBS geometry in the FEA application. This technology offers the potential to revolutionise automobile, ship and airplane design and analysis by allowing models to be designed, tested and adjusted in one integrative stage.
Providing a systematic approach to the topic, the authors begin with a tutorial introducing the foundations of Isogeometric Analysis, before advancing to a comprehensive coverage of the most recent developments in the technique. The authors offer a clear explanation as to how to add isogeometric capabilities to existing finite element computer programs, demonstrating how to implement and use the technology. Detailed programming examples and datasets are included to impart a thorough knowledge and understanding of the material.
Provides examples of different applications, showing the reader how to implement isogeometric models
Addresses readers on both sides of the CAD/FEA divide
Describes Non-Uniform Rational B-Splines (NURBS) basis functions

65-02 Research exposition (monographs, survey articles) pertaining to numerical analysis
65D17 Computer-aided design (modeling of curves and surfaces)
65D07 Numerical computation using splines
65M60 Finite element, Rayleigh-Ritz and Galerkin methods for initial value and initial-boundary value problems involving PDEs
65N30 Finite element, Rayleigh-Ritz and Galerkin methods for boundary value problems involving PDEs
Full Text: DOI