Itoh, Nobuyuki; Kojima, Kenji; Ohguro, Tatsuya Journal home. (English) Zbl 1068.78509 Int. J. Numer. Model. 18, No. 4, 255-266 (2005). Cited in 4 Documents MSC: 78A55 Technical applications of optics and electromagnetic theory Keywords:MOSFET; short channel; channel thermal noise; VCO; phase noise PDFBibTeX XMLCite \textit{N. Itoh} et al., Int. J. Numer. Model. 18, No. 4, 255--266 (2005; Zbl 1068.78509) Full Text: DOI References: [1] . MOSFET modeling for RF circuit design. Presentation of MOS-AK Workshop, Leuven, September 2004. [2] , , , , , , , , , , , , . Improvement of 1/f noise by using VHP(Vertical High Pressure) oxynitride gate insulator for deep-sub micron RF and analog CMOS. Symposium of the VLSI Technical Digest, Kyoto, 1999; 119-120. [3] , , , , , , , . The impact of oxynitride process, deuterium annealing and STI stress to 1/f noise of 0.11 {\(\mu\)}m CMOS. Symposium of the VLSI Technical Digest, 2003. [4] , , , , , , , . A study of analog characteristics of CMOS with heavily nitrided NO oxynitrides. Symposium of the VLSI Technical Digest, 2001. [5] , , . Accurate modeling of trench isolation induced mechanical stress effects on MOSFET electrical performance. Proceedings of International Electron Device Meeting, 2002. [6] Abidi, IEEE Transactions on Electron Devices ED-33 pp 1801– (1986) [7] Triantis, IEEE Transactions on Electron Devices 43 pp 1950– (1996) [8] Klein, IEEE Electron Device Letters 20 pp 399– (1999) [9] , , , , , , , , , . Accurate thermal noise modeling for deep-submicron CMOS. Proceedings of International Electron Device Meeting 1999; 155-158. [10] , , . Thermal channel noise of quarter and sub-quarter micron NMOS FET’s. Proceedings of ICMTS 2000; 95-98. [11] Enz, IEEE Transactions on Solid-State Circuits 35 pp 186– (2000) [12] Knoblinger, IEEE Journal of Solid-State Circuits 36 pp 831– (2001) [13] , , , , , , , , . Compact modeling of drain and gate current for RF CMOS. Proceedings of International Elecron Device Meeting 2002; 129-132. [14] Scholten, IEEE Transactions on Electron Devices 50 pp 618– (2003) [15] , , . MOSFET modeling for low noise, RF circuit design. Proceedings of Custom Integrated Circuit Conference 2002; 201-208. [16] Chen, IEEE Transactions on Electron Devices 49 pp 1484– (2002) [17] , , . Analytical modeling of MOSFET noise parameters for analog and RF applications. Proceedings of Custom Integrated Circuit Conference 2004; 379-382. [18] , . Enhanced analytic noise model for RF CMOS design. Proceedings of Custom Integrated Circuit Conference 2004; 383-386. [19] . Operation and Modeling of the MOS Transistor. McGraw-Hill: New York, 1988. [20] , , . A unified model for the hot-electron currents in MOSFET’s. Proceedings of International Electron Device Meeting 1981; 600-603. [21] Itoh, IEICE Transactions of Fundamentals E86-A pp 288– (2003) [22] Craninckx, IEEE Journal of Solid-State Circuits 30 pp 1474– (1995) [23] Steyaert, Analog Integrated Circuits and Signal Processing 24 pp 83– (2000) This reference list is based on information provided by the publisher or from digital mathematics libraries. Its items are heuristically matched to zbMATH identifiers and may contain data conversion errors. In some cases that data have been complemented/enhanced by data from zbMATH Open. This attempts to reflect the references listed in the original paper as accurately as possible without claiming completeness or a perfect matching.