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Fast time-domain characterization of finite size microstrip structures. (English) Zbl 1009.78006

Summary: A new fast integral-equation-based scheme for analysing electromagnetic transients on finite size microstrip structures is described. The scheme permits the analysis of structures comprised of perfect electrically conducting surfaces and wires along with lossless but potentially inhomogeneous dielectric regions. For typical microstrip structures, the computational complexity of the proposed analysis tool grows as \(O(N_t N_{sv} \log^2 N_{sv})\), where \(N_t\), denotes the number of time steps in the analysis, \(N_{sv}= N_s+ N_v\) and \(N_s\) and \(N_v\) represent the number of spatial unknowns that model currents on conducting surfaces/wires/junctions and in penetrable volumes, respectively. This complexity estimate is in stark contrast with that for classical marching-on-in-time solvers, which require \(O(N_t N_{sv}^2)\) CPU resources.

MSC:

78M10 Finite element, Galerkin and related methods applied to problems in optics and electromagnetic theory
65R20 Numerical methods for integral equations
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