Zhao, Junfeng; Chen, Deqin; Xu, Yong; Shi, Yimin Emprical Bayes test for one-side truncation parameters with asymmetric loss functions using NA samples. (English) Zbl 1092.62004 Int. J. Pure Appl. Math. 27, No. 1, 11-20 (2006). Summary: In the case of negatively associated (NA) samples, this paper is to investigate empirical Bayes tests of parameters in one-side truncated distribution families under the asymmetric loss function of the form \[ L(\theta,\theta_0)=k_1(\theta-\theta_0)^2I_{(\theta<\theta_0)}+ \bigl[k_1(\theta-\theta_0)^2+k_2(\theta-\theta_0)\bigr]I_{(\theta\geq \theta_0)},\quad k_i\geq 0,\;i=1,2. \] Kernel estimation of probability density functions is used to construct EB test functions, and their asymptotic optimality is obtained. MSC: 62C12 Empirical decision procedures; empirical Bayes procedures PDFBibTeX XMLCite \textit{J. Zhao} et al., Int. J. Pure Appl. Math. 27, No. 1, 11--20 (2006; Zbl 1092.62004)