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Sun, Tianyu; Shi, Yimin; Wei, Wei A reliability analysis for B-S components under progressive hybrid type-I censoring test. (Chinese. English summary) Zbl 1324.62064 Syst. Eng. Electron. 36, No. 11, 2326-2331 (2014). MSC: 62N05 PDFBibTeX XMLCite \textit{T. Sun} et al., Syst. Eng. Electron. 36, No. 11, 2326--2331 (2014; Zbl 1324.62064)
Li, Feng; Shi, Yimin; Jing, Yuan Bayesian estimation of environmental factors of two-parameter of Weibull distributions. (Chinese. English summary) Zbl 1174.62592 Syst. Eng. Electron. 30, No. 1, 186-189 (2008). MSC: 62P30 62F15 PDFBibTeX XMLCite \textit{F. Li} et al., Syst. Eng. Electron. 30, No. 1, 186--189 (2008; Zbl 1174.62592)