Qu, Gaizhu Lie symmetry analysis of a higher-order thin film equation. (Chinese. English summary) Zbl 1374.76190 J. Northwest Norm. Univ., Nat. Sci. 52, No. 6, 18-21, 37 (2016). Summary: In this paper, a Lie symmetry analysis approach is developed to study a higher-order nonlinear thin film equation. Using the infinitesimal generators, the Lie algebra and its optimal system of the higher-order thin film equation are derived. The equation is then reduced to ordinary differential equations. As a result, some physically interesting solutions are obtained and discussed. MSC: 76M60 Symmetry analysis, Lie group and Lie algebra methods applied to problems in fluid mechanics Keywords:higher-order nonlinear thin film equation; Lie symmetry analysis; invariant solution PDFBibTeX XMLCite \textit{G. Qu}, J. Northwest Norm. Univ., Nat. Sci. 52, No. 6, 18--21, 37 (2016; Zbl 1374.76190) Full Text: DOI