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Phase-locked loop design applied to frequency-modulated atomic force microscope. (English) Zbl 1229.93123

Summary: The Atomic Force Microscope (AFM) introduced the surface investigation with true atomic resolution. In the Frequency Modulation Technique (FM-AFM) both the amplitude and the frequency of oscillation of the micro-cantilever must be kept constant even in the presence of tip-surface interaction forces. For that reason, the proper design of the Phase-Locked Loop (PLL) used in FM-AFM is vital to system performance. Here, the mathematical model of the FM-AFM control system is derived considering high order PLL. In addition, a method to design stable third-order phase-locked loops is presented.

MSC:

93C95 Application models in control theory
74M25 Micromechanics of solids
37N35 Dynamical systems in control
93A30 Mathematical modelling of systems (MSC2010)
93B52 Feedback control
34H05 Control problems involving ordinary differential equations
93C15 Control/observation systems governed by ordinary differential equations
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