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Orieux, François; Sepulveda, Eduardo; Loriette, Vincent; Dubertret, Benoit; Olivo-Marin, Jean-Christophe Bayesian estimation for optimized structured illumination microscopy. (English) Zbl 1373.62105 IEEE Trans. Image Process. 21, No. 2, 601-614 (2012). MSC: 62F15 62H35 92C55 94A08 94A14 PDF BibTeX XML Cite \textit{F. Orieux} et al., IEEE Trans. Image Process. 21, No. 2, 601--614 (2012; Zbl 1373.62105) Full Text: DOI