Lukina, Anna; Esterle, Lukas; Hirsch, Christian; Bartocci, Ezio; Yang, Junxing; Tiwari, Ashish; Smolka, Scott A.; Grosu, Radu ARES: adaptive receding-horizon synthesis of optimal plans. (English) Zbl 1453.90181 Legay, Axel (ed.) et al., Tools and algorithms for the construction and analysis of systems. 23rd international conference, TACAS 2017, held as part of the European joint conferences on theory and practice of software, ETAPS 2017, Uppsala, Sweden, April 22–29, 2017. Proceedings. Part II. Berlin: Springer. Lect. Notes Comput. Sci. 10206, 286-302 (2017). MSC: 90C40 68W25 68W50 90C59 PDFBibTeX XMLCite \textit{A. Lukina} et al., Lect. Notes Comput. Sci. 10206, 286--302 (2017; Zbl 1453.90181) Full Text: DOI arXiv
Hirsch, Christian; Jahnel, Benedikt; Keeler, Paul; Patterson, Robert I. A. Traffic flow densities in large transport networks. (English) Zbl 1425.60080 Adv. Appl. Probab. 49, No. 4, 1091-1115 (2017). MSC: 60K30 60F15 90B20 PDFBibTeX XMLCite \textit{C. Hirsch} et al., Adv. Appl. Probab. 49, No. 4, 1091--1115 (2017; Zbl 1425.60080) Full Text: DOI arXiv
Neuhäuser, David; Hirsch, Christian; Gloaguen, Catherine; Schmidt, Volker A parametric copula approach for modelling shortest-path trees in telecommunication networks. (English) Zbl 1395.90062 Dudin, Alexander (ed.) et al., Analytical and stochastic modeling techniques and applications. 20th international conference, ASMTA 2013, Ghent, Belgium, July 8–10, 2013. Proceedings. Berlin: Springer (ISBN 978-3-642-39407-2/pbk). Lecture Notes in Computer Science 7984, 324-336 (2013). MSC: 90B18 PDFBibTeX XMLCite \textit{D. Neuhäuser} et al., Lect. Notes Comput. Sci. 7984, 324--336 (2013; Zbl 1395.90062) Full Text: DOI
Neuhäuser, D.; Hirsch, C.; Gloaguen, C.; Schmidt, V. On the distribution of typical shortest-path lengths in connected random geometric graphs. (English) Zbl 1275.60018 Queueing Syst. 71, No. 1-2, 199-220 (2012). MSC: 60D05 60G55 60F99 90B15 PDFBibTeX XMLCite \textit{D. Neuhäuser} et al., Queueing Syst. 71, No. 1--2, 199--220 (2012; Zbl 1275.60018) Full Text: DOI