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On a new scaling for semiconductor device equations and its asymptotic analysis. (English) Zbl 1012.82029

Summary: The aim of this paper is to present a new scaling which is appropriate for modeling reverse biased semiconductor devices with moderately high applied potential and its asymptotic analysis. This scaling was motivated by the modeling of oxygen sensors. It is compared to the ones leading to (a) electroneutrality, (b) the existence of a depletion zone. With our scaling such a zone may appear within a boundary layer. A particular attention is paid to the qualitative dependence of the asymptotic solution to the boundary value of the concentration of carrier.

MSC:

82D37 Statistical mechanics of semiconductors
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[1] DOI: 10.1142/S0218202598000202 · Zbl 0912.35032 · doi:10.1142/S0218202598000202
[2] DOI: 10.1016/0925-4005(93)85344-A · doi:10.1016/0925-4005(93)85344-A
[3] DOI: 10.1007/BFb0072681 · doi:10.1007/BFb0072681
[4] DOI: 10.1137/0520024 · Zbl 0693.34015 · doi:10.1137/0520024
[5] Henry J., Asymptotic Anal. 10 pp 1– (1995)
[6] DOI: 10.1142/S0218202597000050 · Zbl 0871.35009 · doi:10.1142/S0218202597000050
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