Saha, Mahendra; Dey, Sanku; Nadarajah, Saralees Parametric inference of the process capability index \(\mathcal{C}_{pc}\) for exponentiated exponential distribution. (English) Zbl 07630086 J. Appl. Stat. 49, No. 16, 4097-4121 (2022). MSC: 62-XX PDFBibTeX XMLCite \textit{M. Saha} et al., J. Appl. Stat. 49, No. 16, 4097--4121 (2022; Zbl 07630086) Full Text: DOI
Shakhatreh, Mohammed K.; Dey, Sanku; Kumar, Devendra Inverse Lindley power series distributions: a new compounding family and regression model with censored data. (English) Zbl 07611111 J. Appl. Stat. 49, No. 13, 3451-3476 (2022). MSC: 62-XX PDFBibTeX XMLCite \textit{M. K. Shakhatreh} et al., J. Appl. Stat. 49, No. 13, 3451--3476 (2022; Zbl 07611111) Full Text: DOI
Dey, Sanku; Wang, Liang; Nassar, Mazen Inference on Nadarajah-Haghighi distribution with constant stress partially accelerated life tests under progressive type-II censoring. (English) Zbl 07584973 J. Appl. Stat. 49, No. 11, 2891-2912 (2022). MSC: 62-XX PDFBibTeX XMLCite \textit{S. Dey} et al., J. Appl. Stat. 49, No. 11, 2891--2912 (2022; Zbl 07584973) Full Text: DOI
Tripathi, Harsh; Dey, Sanku; Saha, Mahendra Double and group acceptance sampling plan for truncated life test based on inverse log-logistic distribution. (English) Zbl 1521.62505 J. Appl. Stat. 48, No. 7, 1227-1242 (2021). MSC: 62-XX PDFBibTeX XMLCite \textit{H. Tripathi} et al., J. Appl. Stat. 48, No. 7, 1227--1242 (2021; Zbl 1521.62505) Full Text: DOI
Singh, Sukhdev; Dey, Sanku; Kumar, Devendra Statistical inference based on generalized Lindley record values. (English) Zbl 1521.62483 J. Appl. Stat. 47, No. 9, 1543-1561 (2020). MSC: 62-XX PDFBibTeX XMLCite \textit{S. Singh} et al., J. Appl. Stat. 47, No. 9, 1543--1561 (2020; Zbl 1521.62483) Full Text: DOI
Dey, Sanku; Nassar, Mazen Classical methods of estimation on constant stress accelerated life tests under exponentiated Lindley distribution. (English) Zbl 1521.62296 J. Appl. Stat. 47, No. 6, 975-996 (2020). MSC: 62-XX PDFBibTeX XMLCite \textit{S. Dey} and \textit{M. Nassar}, J. Appl. Stat. 47, No. 6, 975--996 (2020; Zbl 1521.62296) Full Text: DOI
Dey, Sanku; Saha, Mahendra Bootstrap confidence intervals of generalized process capability index \(C_{pyk}\) using different methods of estimation. (English) Zbl 1516.62246 J. Appl. Stat. 46, No. 10, 1843-1869 (2019). MSC: 62-XX PDFBibTeX XMLCite \textit{S. Dey} and \textit{M. Saha}, J. Appl. Stat. 46, No. 10, 1843--1869 (2019; Zbl 1516.62246) Full Text: DOI
Dey, Sanku; Dey, Tanujit On progressively censored generalized inverted exponential distribution. (English) Zbl 1514.62525 J. Appl. Stat. 41, No. 12, 2557-2576 (2014). MSC: 62-XX PDFBibTeX XMLCite \textit{S. Dey} and \textit{T. Dey}, J. Appl. Stat. 41, No. 12, 2557--2576 (2014; Zbl 1514.62525) Full Text: DOI