Hager, Harold W.; Bain, Lee J.; Antle, Charles E. Reliability estimation for the generalized gamma distribution and robustness of the Weibull model. (English) Zbl 0225.62071 Technometrics 13, 547-557 (1971). MSC: 62H12 62H10 PDFBibTeX XMLCite \textit{H. W. Hager} et al., Technometrics 13, 547--557 (1971; Zbl 0225.62071) Full Text: DOI
Hager, Harold W.; Bain, Lee J. Inferential procedures for the generalized gamma distribution. (English) Zbl 0224.62014 J. Am. Stat. Assoc. 65, 1601-1609 (1970). MSC: 62F10 PDFBibTeX XMLCite \textit{H. W. Hager} and \textit{L. J. Bain}, J. Am. Stat. Assoc. 65, 1601--1609 (1970; Zbl 0224.62014) Full Text: DOI